The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2024
Filed:
Sep. 18, 2023
Applicant:
Xwinsys Technology Developments Ltd., Migdal HaEmek, IL;
Inventors:
Assignee:
XWINSYS Technology Developments Ltd., Migdal HaEmek, IL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/20 (2018.01); G01N 23/04 (2018.01); G01N 23/20025 (2018.01);
U.S. Cl.
CPC ...
G01N 23/043 (2013.01); G01N 23/20025 (2013.01);
Abstract
An X-ray inspection system and method are presented. The system comprising: at least two X-ray sources positioned and oriented at selected angles with respect to an inspection plane, to provide a common illumination spot on said inspection plane, thereby enabling inspection of common regions of a sample with at least one of increased irradiation intensity or two or more different irradiation characteristics while reducing navigation and registration processing.