This inventor holds 2 USPTO granted patents. Top assignee: Rigaku Corporation. Active years: 2007-2017.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Tokyo, JP (2007)
- Hino, JP (2017)
Company Filing History:
Years Active: 2007-2017
Title: The Innovations of Atsunori Kiku
Introduction
Atsunori Kiku is a notable inventor based in Hino, Japan. He has made significant contributions to the field of X-ray technology, holding a total of 2 patents. His work focuses on developing advanced apparatuses for X-ray inspection and imaging.
Latest Patents
Kiku's latest patents include an X-ray topography apparatus and an X-ray thin film inspection apparatus. The X-ray topography apparatus features an X-ray source, a multilayer film mirror, a slit, a two-dimensional X-ray detector, and a sample moving device. This innovative design allows for high-contrast X-ray images, enhancing the observation capabilities within a short exposure time. The second patent, the X-ray thin film inspection apparatus, includes a sample table, a positioning mechanism, and a goniometer with swing arms. This apparatus is designed for inspecting products such as wafers, utilizing X-ray technology for pattern recognition.
Career Highlights
Atsunori Kiku is associated with Rigaku Corporation, a company known for its advancements in X-ray technology and analytical instruments. His work at Rigaku has positioned him as a key player in the development of innovative X-ray inspection solutions.
Collaborations
Kiku collaborates with talented individuals such as Kazuhiko Omote and Hiroshi Motono. Their combined expertise contributes to the advancement of X-ray technology and its applications in various fields.
Conclusion
Atsunori Kiku's contributions to X-ray technology through his patents and work at Rigaku Corporation highlight his role as an influential inventor. His innovations continue to impact the field, enhancing the capabilities of X-ray inspection and imaging.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
