Arthur M Ryan

Title: The Innovations of Arthur M Ryan

Introduction

Arthur M Ryan is a notable inventor based in Round Rock, TX (US). He has made significant contributions to the field of processor testing, holding a total of 8 patents. His work focuses on enhancing the reliability and efficiency of processor systems.

Latest Patents

One of his latest patents is titled "Processor test system utilizing functional redundancy." This invention describes a system and method for testing a processor, which includes a gold processor and a test processor, where the test processor serves as the device under test (DUT). Both processors are identical, and the system features a first memory coupled to the gold processor and a second memory, independent of the first, coupled to the test processor. A memory bus comparator is included to compare memory bus signals and provide indications of any mismatches. Another significant patent is "System and method for controlling synchronous functional microprocessor redundancy during test and analysis." This system allows for simultaneous testing of a processor, ensuring that both the gold processor and the DUT operate in synchronous functional lockstep.

Career Highlights

Arthur has worked with prominent companies such as National Instruments Corporation and Globalfoundries Inc. His experience in these organizations has contributed to his expertise in processor testing technologies.

Collaborations

Throughout his career, Arthur has collaborated with talented individuals, including Hugo A Andrade and Michael L Choate. These collaborations have likely enriched his work and led to innovative advancements in his field.

Conclusion

Arthur M Ryan's contributions to processor testing through his patents and collaborations highlight his importance as an inventor. His work continues to influence the development of reliable processor systems.