National Instruments Corporation

Globalfoundries Inc.

Advanced Micro Devices Corporation

Arthur M Ryan

Hugo A Andrade

Michael L Choate

Kevin E Ayers

Douglas L Terrell

Brian Keith Odom

Heather Lynn Hanson

Rodney W Cummings

B Keith Odom

Mark D Nicol

Chandrakant Pandya

Michael J Borsch

Ha Nguyen

A system and method for testing a processor. The system includes a gold processor and a test processor, wherein the test processor is the device under test (DUT). The test processor and the gold processor are identical. A first memory is coupled to the gold processor by a first memory bus and a second memory, independent of the first, is coupled to the test processor by a second memory bus. The first and second memories are identical. A memory bus comparator coupled to the first and second memory buses compares memory bus signals generated by the gold and test processors, and selectively provide a first indication if a mismatch occurs. A peripheral bus comparator is also coupled to the gold and test processors, and compares downstream transactions generated by the gold and test processors and to provide a second indication if a peripheral bus comparison results in a mismatch.

Processor test system utilizing functional redundancy

A system for testing a processor. The system includes a gold processor and a test access port (TAP). A processor that is a under test (DUT) is coupled to both the gold processor and the TAP. Test signals are simultaneously provided to both the gold processor and the DUT such that the gold processor and the DUT operate in synchronous functional lockstep. The TAP may also input test signals into the gold processor and DUT simultaneously and access data from each of these processors through separate test data out (TDO) connections. Test output data accessed from the gold processor may be compared to test output data accessed from the DUT to determine if any differences are present. The comparison data generated may then be used for analysis purposes.

System and method for controlling synchronous functional microprocessor redundancy during test and analysis

A system for testing a processor. The system includes a gold processor and a test access port (TAP). A processor that is a device under test (DUT) is coupled to both the gold processor and the TAP. In the first mode, the TAP provides test signals to both the gold processor and the DUT while they operate in synchronous functional lockstep. In the second mode, the TAP provides signals to the gold processor. In the third mode, the TAP provides test signals to the DUT. A host computer coupled to the interface control unit executes a software application to cause the TAP to drive test signals and to access test output data from the gold processor and the DUT. Test output data accessed from the gold processor may be compared to that accessed from the DUT to determine any differences. The comparison data generated may then be used for further analysis.

System and method for controlling synchronous functional microprocessor redundancy during test and method for determining results

A reconfigurable test system including a host computer coupled to a reconfigurable test instrument. The reconfigurable test instrument includes reconfigurable hardware&#x2014;i.e. a reconfigurable hardware module with one or more programmable elements such as Field Programmable Gate Arrays for realizing an arbitrary hardware architecture and a reconfigurable front end with programmable transceivers for interfacing with any desired physical medium&#x2014;and optionally, an embedded processor. A user specifies system features with a software configuration utility which directs a component selector to select a set of software modules and hardware configuration files from a series of libraries. The modules are embedded in a host software driver or downloaded for execution on the embedded CPU. The configuration files are downloaded to the reconfigurable hardware. The entire selection process is performed in real-time and can be changed whenever the user deems necessary. Alternatively, the user may create a graphical program in a graphical programming environment and compile the program into various software modules and configuration files for host execution, embedded processor execution, or programming the reconfigurable hardware.

Reconfigurable test system

A modular telecommunication test system is presented including a portable computer system and at least one portable telecommunication test module located external to the computer system. The portable computer system stores a telecommunication test application (e.g., in a memory system). Each test module includes a communication port having an electrical connector, and is thus adapted for coupling to the portable computer system. Each test module also includes electrical circuitry for performing a set of telecommunication tests, wherein each test involves making at least one electrical measurement upon a telecommunication service installation. In coupling a given test module to the portable computer system, a user configures the test system to perform the set of telecommunication tests associated with the given test module. The at least one test module is selected from a group of test modules, each configured to perform telecommunication tests upon a different type of telecommunication service installation. Eligible types of telecommunication service installations include POTS, T1/E1, ISDN, and xDSL. The test system may also include a second computer system (e.g., a desktop computer system) coupled to the first computer system via a communication network. The communication network may include the PSTN and the Internet. The first computer may receive telecommunication test data from each test module and provide the test data to the second computer system via the communication network.

System and method for testing telecommunication service installations

An apparatus for receiving an asynchronous data signal may include a clock generator that generates a clock signal having a frequency approximately equal to the bit rate of the asynchronous data signal. An edge detector may detect transitions of the asynchronous data signal. A dead-band detector may detect when a transition of the clock signal used to sample the data signal occurs within a predetermined amount of time of a transition of the asynchronous data signal so that data sampled on that transition of the clock signal may be invalid. The phase of the clock signal may be adjusted if the transition of the clock signal occurs within this predetermined amount of time. The clock generator may include two programmable counters, one which may be programmed with a bit-rate value so that it generates a signal approximately matching the bit rate of the asynchronous data signal, and the other programmed with a phase-delay value so that it generates a sample clock signal at a phase delay from the signal generated by the first counter. The phase of the sample clock may be adjusted by restarting the counters in response to a transition on the asynchronous data signal. Data may be supplied to a serial-to-parallel converter including a first shift register configured to shift a data word in serially and output the data word in parallel and a second shift register configured to track when the data word had been completely shifted into the first shift register.

Clock synchronization for asynchronous data transmission

A reconfigurable test system including a host computer coupled to a reconfigurable test instrument. The reconfigurable test instrument includes reconfigurable hardware&mdash;i.e. a reconfigurable hardware module with one or more programmable elements such as Field Programmable Gate Arrays for realizing an arbitrary hardware architecture and a reconfigurable front end with programmable transceivers for interfacing with any desired physical medium&mdash;and optionally, an embedded processor. A user specifies system features with a software configuration utility which directs a component selector to select a set of software modules and hardware configuration files from a series of libraries. The modules are embedded in a host software driver or downloaded for execution on the embedded CPU. The configuration files are downloaded to the reconfigurable hardware. The entire selection process is performed in real-time and can be changed whenever the user deems necessary. Alternatively, the user may create a graphical program in a graphical programming environment and compile the program into various software modules and configuration files for host execution, embedded processor execution, or programming the reconfigurable hardware.

A clock synchronizer may include two programmable counters, one which may be programmed with a bit-rate value so that it generates a signal approximately matching the bit rate of the asynchronous data signal, and the other programmed with a phase-delay value so that it generates a sample clock signal at a phase delay from the signal generated by the first counter. The phase of the sample clock may be adjusted by restarting the counters in response to a transition on the asynchronous data signal. Data may be supplied to a serial-to-parallel converter including a first shift register configured to shift a data word in serially and output the data word in parallel and a second shift register configured to track when the data word had been completely shifted into the first shift register and to cause the data word to be outputted in parallel from the first shift register so that a new word may be shifted into the first shift register. A status value may be loaded into the second shift register so that when the last bit is converted in the first shift register, the second shift register shifts out a conversion completed indication. The bit length to be converted may be changed by loading a different status value into the second shift register. This same technique may be employed in a parallel-to-serial data converter or in a general data converter that may convert from serial-to-parallel or parallel-to-serial according to a conversion-type signal.

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Round Rock, TX, United States of America

Arthur M Ryan