Company Filing History:
Years Active: 2023-2025
Title: Innovations by Apik A. Zorian: A Pioneering Mind in Machine Learning and Design-for-Test Systems
Introduction: Apik A. Zorian is an innovative inventor based in Santa Clara, California, known for his contributions to the fields of machine learning and design-for-test (DFT) systems. With one patented invention under his belt, Zorian is making waves in the tech industry, driving improvements in automatic test pattern generation (ATPG) quality of results.
Latest Patents: Zorian's notable patent is a machine-learning-based design-for-test recommendation system. This innovative technology enhances ATPG quality by utilizing training data that is collected from test-case configurations across various integrated circuit (IC) designs. The invention intelligently extracts features from each IC design and determines the necessary test cycles required to achieve target test coverage. A trained machine learning (ML) model leverages this training data to predict a ranked set of test-case configurations tailored for specific IC designs, ultimately leading to streamlined testing and higher quality outcomes.
Career Highlights: Apik A. Zorian works for Synopsys, Inc., a prominent company recognized for its cutting-edge solutions in electronic design automation (EDA). His role at Synopsys allows him to apply his expertise in multiple dimensions, contributing to significant advancements in the technology sector.
Collaborations: During his career, Zorian collaborates with talented professionals such as Fadi Maamari and Suryanarayana Duggirala, enhancing the pool of innovation through teamwork and shared knowledge. These collaborations not only foster innovation but also drive the development of new technologies that further elevate the standard within the industry.
Conclusion: Apik A. Zorian represents the pioneering spirit of inventors who leverage advanced technologies to overcome challenges in the field of electronic design. His unique approach, epitomized through his pioneering patent, signifies his commitment to improving design efficiencies and enhancing the quality of electronic testing processes in the rapidly evolving technological landscape.