The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2023

Filed:

Jun. 11, 2021
Applicant:

Synopsys, Inc., Mountain View, CA (US);

Inventors:

Apik A Zorian, Santa Clara, CA (US);

Fadi Maamari, San Jose, CA (US);

Suryanarayana Duggirala, San Jose, CA (US);

Mahilchi Milir Vaseekar Kumar, San Jose, CA (US);

Basim Mohammed Issa Shanyour, Carbondale, IL (US);

Assignee:

Synopsys, Inc., Sunnyvale, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/27 (2020.01); G01R 31/3185 (2006.01); G01R 31/3177 (2006.01);
U.S. Cl.
CPC ...
G06F 30/27 (2020.01); G01R 31/3177 (2013.01); G01R 31/318536 (2013.01);
Abstract

Training data may be collected based on a set of test-case configurations for each integrated circuit (IC) design in a set of IC designs. The training data may include a set of features extracted from each IC design, and a count of test cycles required for achieving a target test coverage for each test-case configuration. A machine learning (ML) model may be trained using the training data to obtain a trained ML model. The trained ML model may be used to predict a set of ranked test-case configurations for a given IC design based on features extracted from the given IC design.


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