The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2025
Filed:
Oct. 18, 2023
Applicant:
Synopsys, Inc., Sunnyvale, CA (US);
Inventors:
Apik A. Zorian, Santa Clara, CA (US);
Fadi Maamari, San Jose, CA (US);
Suryanarayana Duggirala, San Jose, CA (US);
Mahilchi Milir Vaseekar Kumar, San Jose, CA (US);
Basim Mohammed Issa Shanyour, Carbondale, IL (US);
Assignee:
SYNOPSYS, INC., Sunnyvale, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/27 (2020.01); G01R 31/3177 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G06F 30/27 (2020.01); G01R 31/3177 (2013.01); G01R 31/318536 (2013.01);
Abstract
A first set of features may be extracted from a first integrated circuit (IC) design. A trained machine learning (ML) model may predict a set of ranked test-case configurations for the first IC design based on the first set of features. A test-case configuration may correspond to a count of scan chain input and output ports and a scan chain length value.