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For the Inventor, By the Inventor

Santa Clara, CA, United States of America

Anthony Le

USPTO Granted Patents = 17

Average Co-Inventor Count = 2.8

ph-index = 7

Forward Citations = 136(Granted Patents)


Company Filing History:

goldMedal17 out of 2,253 
 
Adv Antest Corporation
 patents

Years Active: 2001-2008

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17 patents (USPTO):Explore Patents
1. 7437589 - Providing precise timing control within a standardized test instrumentation chassis (2008-10-14),
2. 7437588 - Circuit card synchronization within a standardized test instrumentation chassis (2008-10-14),
3. 7366939 - Providing precise timing control between multiple standardized test instrumentation chassis (2008-04-29),
4. 7171602 - Event processing apparatus and method for high speed event based test system (2007-01-30),
5. 7089135 - Event based IC test system (2006-08-08),
6. 7010452 - Event pipeline and summing method and apparatus for event based test system (2006-03-07),
7. 6934896 - Time shift circuit for functional and AC parametric test (2005-08-23),
8. 6804620 - Calibration method for system performance validation of automatic test equipment (2004-10-12),
9. 6771062 - Apparatus for supporting and manipulating a testhead in an automatic test equipment system (2004-08-03),
10. 6747447 - Locking apparatus and loadboard assembly (2004-06-08),
11. 6710590 - Test head Hifix for semiconductor device testing apparatus (2004-03-23),
12. 6668331 - Apparatus and method for successively generating an event to establish a total delay time that is greater than can be expressed by specified data bits in an event memory (2003-12-23),
13. 6594609 - Scan vector support for event based test system (2003-07-15),
14. 6578169 - Data failure memory compaction for semiconductor test system (2003-06-10),
15. 6404218 - Multiple end of test signal for event based test system (2002-06-11),

Title: The Innovations of Anthony Le

Introduction

Anthony Le is a prominent inventor based in Santa Clara, CA. He has made significant contributions to the field of test instrumentation, holding a total of 17 patents. His work focuses on enhancing the precision and efficiency of testing systems, particularly within standardized chassis.

Latest Patents

One of Anthony's latest patents involves circuit card synchronization within a standardized test instrumentation chassis. This innovation provides precise timing control by utilizing several control signals over PXI_LOCAL. A Least Common Multiple (LCM) signal ensures that all clocks have coincident clock edges at every LCM edge. Additionally, a start sequence allows all PXI expansion cards in the test system to initiate simultaneously. The MATCH line enables pincard modules to verify expected Device Under Test (DUT) outputs, allowing them to either continue their local test programs or loop back to repeat sections based on the DUT output check. Furthermore, an End Of Test (EOT) line allows any pincard module to abruptly terminate the local test programs running in other modules if an error is detected.

Career Highlights

Anthony Le is currently employed at Adv Antest Corporation, where he continues to innovate and develop advanced testing solutions. His expertise in timing control and synchronization has positioned him as a key player in the industry.

Collaborations

Throughout his career, Anthony has collaborated with talented individuals such as Rochit Rajsuman and James Alan Turnquist. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Anthony Le's contributions to the field of test instrumentation are noteworthy, with a focus on precision and efficiency. His innovative patents and collaborations highlight his commitment to advancing technology in this critical area.

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