Mountain View, CA, United States of America

Anna-Katrina Shedletsky

This inventor holds 105 USPTO granted patents and 20 published patent applications and 3 EPO patents, primarily in Electronic Devices (CPC class G06F3-0362). Top assignees: Apple Inc., Instrumental, Inc., Other. Active years: 2012-2026.

USPTO Granted Patents = 105 

% Patents Active = 85.7

 

Average Co-Inventor Count = 3.7

ph-index = 22

Forward Citations = 1,669(Granted Patents)

Forward Citations (Not Self Cited) = 1,473(Dec 10, 2025)


Inventors with similar research interests:


Location History:

  • Cupertino, CA (US) (2016 - 2018)
  • Sunnyvale, CA (US) (2012 - 2024)
  • Mountain View, CA (US) (2013 - 2024)
  • Palo Alto, CA (US) (2019 - 2024)

Company Filing History:

goldMedal84 out of 43,427 
 
Apple Inc.
 patents
silverMedal19 out of 19 
 
Instrumental, Inc.
 patents
bronzeMedal1 out of 834,411 
Other
 patents
where one patent can have more than one assignee

Years Active: 2012-2026

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Areas of Expertise:
Capacitive Touch Panel
Optical Inspection Station
Defect Prediction
Electronic Displays
Assembly Monitoring
Rotary Input Mechanism
Power Consumption Management
Wearable Device
Waterproof Button Assembly
Light Sensors
Manufacturing Limits
Proximity Detection
105 patents (USPTO):Explore Patents

Title: Anna-Katrina Shedletsky: Innovator in Manufacturing Defect Prediction

Introduction

Anna-Katrina Shedletsky, based in Mountain View, CA, is an accomplished inventor with an impressive portfolio of 96 patents. Her work primarily focuses on innovations in the field of manufacturing and assembly unit inspection, reflecting a dedication to enhancing product quality and production efficiency.

Latest Patents

Among her latest patents is the "Method for predicting defects in assembly units." This innovative approach utilizes a comprehensive analysis of inspection images captured by optical inspection stations. The process includes generating vectors from these images, which are then grouped in a multi-dimensional feature space to detect variances that may indicate potential defects in assembly units. By flagging these discrepancies, her method represents a significant advancement in predictive manufacturing technologies.

Another notable patent by Shedletsky is the "Methods for automatically generating a common measurement across multiple assembly units." This method allows users to manually select features from assembly unit images, extract real dimensions, and aggregate these measurements into a digital container. This innovation streamlines the process of obtaining consistent measurements across various units, enhancing accuracy and efficiency in manufacturing.

Career Highlights

Shedletsky's career has included significant positions at prominent technology companies, such as Apple Inc. and Instrumental, Inc. Her experience and expertise in developing advanced inspection methods have played a crucial role in enhancing manufacturing processes within these organizations.

Collaborations

Throughout her career, Anna-Katrina Shedletsky has collaborated with fellow innovators such as Fletcher R. Rothkopf and Samuel Bruce Weiss. These partnerships have enabled her to leverage diverse perspectives and skills, further enriching her contributions to the field of manufacturing technology.

Conclusion

Anna-Katrina Shedletsky's innovative approaches to predicting defects and generating common measurements in manufacturing set her apart as a leader in her field. With an impressive collection of patents and collaborations with notable industry figures, she continues to pave the way for advancements in production technologies, ultimately improving the quality and reliability of manufactured products.

Profile summary based on public USPTO records.
Please report any incorrect information to [email protected]
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