The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2026
Filed:
Nov. 16, 2022
Instrumental, Inc., Palo Alto, CA (US);
Samuel Bruce Weiss, Sunnyvale, CA (US);
Anna-Katrina Shedletsky, Sunnyvale, CA (US);
Rustem Feyzkhanov, Sunnyvale, CA (US);
Isaac Sukin, Sunnyvale, CA (US);
Jack Robbins, Sunnyvale, CA (US);
Juyong Do, Sunnyvale, CA (US);
Prerna Dhareshwar, Sunnyvale, CA (US);
Instrumental, Inc., Palo Alto, CA (US);
Abstract
A method includes accessing feature values representing a historical population of assembly units assembled on an assembly line; and accessing a failure status of the assembly unit at a target test on the assembly line. The method also includes, for each feature: deriving a correlation between values of the feature and failure status at the target test; deriving an effective limit of the feature based on scope of feature values in the historical population of assembly units; and calculating an action score for the feature based on the correlation and a width of the effective limit. The method further includes: selecting a particular feature exhibiting greatest action score; defining a preemptive test for the particular feature upstream of the target test during a next assembly period; and assigning a target limit, narrower than an effective limit of the particular feature, to the preemptive test.