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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12762768 B1

PDFFull Text
Date of Patent:
Oct. 13, 2026

Filed:

Apr. 01, 2024

Methods for automatically generating a common measurement across multiple assembly units

Applicant:

Instrumental, Inc., Palo Alto, CA (US);

Inventors:

Samuel Bruce Weiss, Sunnyvale, CA (US);

Anna-Katrina Shedletsky, Sunnyvale, CA (US);

John James Shedletsky, Sunnyvale, CA (US);

Isaac Sukin, Sunnyvale, CA (US);

Simon Kozlov, Sunnyvale, CA (US);

Juyong Do, Sunnyvale, CA (US);

Arseni Kravchenko, Warsaw, PL;

Ken Hua, Sunnyvale, CA (US);

Nic Weidinger, Sunnyvale, CA (US);

Assignee:

Instrumental, Inc., Palo Alto, CA (US);

Attorneys:

Run8 Patent Group, LLC

Peter Miller

Primary Examiner:

Tsung Yin Tsai

Int. Cl.
CPC ...
G06F 3/04845 (2022.01); G06F 3/04842 (2022.01); G06F 3/0485 (2022.01); G06T 7/00 (2017.01); G06T 7/11 (2017.01); G06T 7/13 (2017.01); G06T 7/60 (2017.01); G06T 11/60 (2006.01); G06V 10/44 (2022.01);
U.S. Cl.
CPC ...
G06T 11/60 (2013.01); G06F 3/04842 (2013.01); G06F 3/04845 (2013.01); G06F 3/0485 (2013.01); G06T 7/0004 (2013.01); G06T 7/001 (2013.01); G06T 7/11 (2017.01); G06T 7/13 (2017.01); G06T 7/60 (2013.01); G06V 10/44 (2022.01); G06F 2203/04806 (2013.01); G06T 2200/24 (2013.01); G06T 2207/10004 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/20092 (2013.01); G06T 2207/20164 (2013.01); G06T 2207/20221 (2013.01); G06T 2207/30108 (2013.01); G06V 2201/06 (2022.01);
Abstract

A method includes: identifying a first set of key features in a first inspection image characterizing geometric properties of a set of predefined features; extracting a first set of real dimensions of the first set of key features from the first inspection image; projecting the first set of real dimensions proximal the first set of key features onto the first inspection image; receiving confirmation of a first subset of key features, in the first set of key features, from a user; identifying the first subset of key features in a second inspection image; identifying a second set of key features in the second inspection image characterizing properties of the set of predefined features, the second set of key features distinct from unconfirmed features in the first set of key features; and extracting a second set of real dimensions of the second set of key features from the second inspection image.

Find Patent Forward Citations

Weiss, Samuel. (2026). Methods for automatically generating a common measurement across multiple assembly units (U.S. Patent No. 12762768). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12762768

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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