Sunnyvale, CA, United States of America

Nic Weidinger

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Instrumental, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nic Weidinger. Retrieved from https://idiyas.com/inventor/nic-weidinger

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Nic Weidinger: Inventor in Automated Measurement

Introduction

Nic Weidinger is an inventor based in Sunnyvale, California, and is associated with Instrumental, Inc. His patent work addresses automated measurement from inspection images of assembly units.

Latest Patents

The provided information lists one patent for Weidinger: “Methods for Automatically Generating a Common Measurement Across Multiple Assembly Units.” The method identifies key features in inspection images, extracts their real dimensions, and displays those dimensions near the corresponding features. It also uses user confirmation of selected features to help identify corresponding features in another image and extract additional dimensions. This approach is designed to generate comparable measurements across multiple assembly units.

Career Highlights

Weidinger’s listed patent reflects work on applying image analysis and user feedback to measurement processes. The provided information associates him with Instrumental, Inc., a company focused on manufacturing inspection technology.

Collaborations

The available details connect Weidinger’s patent work with Instrumental, Inc. No additional collaborators are specified in the provided information.

Conclusion

Nic Weidinger’s listed invention combines inspection imagery, feature identification, and dimension extraction to support common measurements across assembly units, and his patent portfolio includes 1 patent.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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