Warsaw, Poland

Arseni Kravchenko

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Instrumental, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Arseni Kravchenko. Retrieved from https://idiyas.com/inventor/arseni-kravchenko

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Arseni Kravchenko: Patent Work in Automated Measurement

Introduction

Arseni Kravchenko is an inventor based in Warsaw, Poland. His patent work includes methods for automatically generating common measurements across multiple assembly units.

Latest Patents

Kravchenko is associated with 1 patent: “Methods for Automatically Generating a Common Measurement Across Multiple Assembly Units.” The method identifies key features in inspection images, extracts their real dimensions, and displays those dimensions near the corresponding features. It also uses user confirmation to identify selected features in a second image and extract measurements from additional features, supporting consistent measurement across assembly units.

Career Highlights

Kravchenko is associated with Instrumental, Inc. His patent describes an approach to image-based inspection that combines automated feature identification and dimension extraction with user confirmation.

Collaborations

The patent’s method incorporates user input to confirm selected features, which are then used to guide feature identification in another inspection image.

Conclusion

Arseni Kravchenko’s patent focuses on making measurements across multiple assembly units more consistent by combining image analysis, dimension extraction, and user confirmation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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