Apple Inc.

Instrumental, Inc.

Other

Anna-Katrina Shedletsky

Fletcher R Rothkopf

Samuel Bruce Weiss

Colin M Ely

Christopher Matthew Werner

Phillip Michael Hobson

Duncan Robert Kerr

Erik G De Jong

Daniele De Iuliis

Jody R Akana

Julian Hoenig

Isaac Sukin

Simon Kozlov

Rico L Zorkendorfer

Jonathan P Ive

Bartley K Andre

Richard P Howarth

Eugene Antony Whang

Peter N Russell-Clarke

Christopher J Stringer

Daniel J Coster

Matthew Dean Rohrbach

Jeremy D Bataillou

Mikael M Silvanto

Adam Duckworth Mittleman

Martha Evans Hankey

Shota Aoyagi

Benjamin Andrew Shaffer

Anthony Michael Ashcroft

Marc A Newson

Stephen Brian Lynch

Paul Stephen Drzaic

Eric Steven Jol

Stephen Paul Zadesky

Tyler S Bushnell

Trevor J Ness

Jason C Sauers

Michael Benjamin Wittenberg

David I Nazzaro

Brad G Boozer

Serhan O Isikman

Makiko K Brzezinski

Benjamin J Kallman

David M Pelletier

Peter J Kardassakis

Katherine E Tong

Ana Ulin

Mikhail Okunev

Camille Moussette

John B Morrell

Prashanth S Holenarsipur

Erik Geddes Pieter De Jong

Tilmann Bruckhaus

John James Shedletsky, Iii

Shilpi Kumar

Ian Theilacker

Brendan Green

Andrzej T Baranski

Trent K Do

Kuldeep P Lonkar

Christopher D Prest

Baboo V Gowreesunker

Ian P Colahan

Pierre M Teplitxky

Shin Nishibori

M Evans Hankey

Douglas Joseph Weber

Rico Zörkendörfer

John B Ardisana, Ii

Steven P Cardinali

Alvin T Chang

John Oskar Ceideburg

Jaseem Aliyar

Ming Leong

Hua Lee Tan

Reilly Hayes

Spencer Purdy

Molly McShane

Nathan Guide

Erik G De Long

One variation of a method for predicting manufacturing defects includes: accessing a first set of inspection images of a first set of assembly units recorded by an optical inspection station over a first period of time; generating a first set of vectors representing features extracted from the first set of inspection images; grouping neighboring vectors in a multi-dimensional feature space into a set of vector groups; accessing a second inspection image of a second assembly recorded by the optical inspection station at a second time succeeding the first period of time; detecting a second set of features in the second inspection image; generating a second vector representing the second set of features in the multi-dimensional feature space; and, in response to the second vector deviating from the set of vector groups by more than a threshold difference, flagging the second assembly unit.

Method for predicting defects in assembly units

One variation of a method for monitoring manufacture of assembly units includes: receiving selection of a target location hypothesized by a user to contain an origin of a defect in assembly units of an assembly type; accessing a feature map linking non-visual manufacturing features to physical locations within the assembly type; for each assembly unit, accessing an inspection image of the assembly unit recorded by an optical inspection station during production of the assembly unit, projecting the target location onto the inspection image, detecting visual features proximal the target location within the inspection image, and aggregating non-visual manufacturing features associated with locations proximal the target location and representing manufacturing inputs into the assembly unit based on the feature map; and calculating correlations between visual and non-visual manufacturing features associated with locations proximal the target location and the defect for the set of assembly units.

Method for monitoring manufacture of assembly units

Various embodiments for detecting and rejecting false, unintended rotations of rotary inputs of electronic devices are disclosed herein. In one example, an electronic device is provided with an optical detector that measures the distance between the electronic device and the wearer's forearm or hand, and when the distance is smaller than a threshold distance, the turns of the rotary input are false, unintended turns. In another example, a crown of a rotary input includes a plurality of capacitive sensors that detects the presence of a wearer's finger, which when absent, the turns of the rotary input are false turns. In another example, deflections or positions of a shaft of the rotary input are measured and if the deflections/positions indicate an upward force on the rotary input (which are likely caused by the wearer's forearm or hand), the turns of the rotary input are false turns. Other embodiments are described herein.

Rejection of false turns of rotary inputs for electronic devices

One variation of a method for automatically generating a common measurement across multiple assembly units includes: displaying a first image—recorded at an optical inspection station—within a user interface; receiving manual selection of a particular feature in a first assembly unit represented in the first image; receiving selection of a measurement type for the particular feature; extracting a first real dimension of the particular feature in the first assembly unit from the first image according to the measurement type; for each image in a set of images, identifying a feature—analogous to the particular feature—in an assembly unit represented in the image and extracting a real dimension of the feature in the assembly unit from the image according to the measurement type; and aggregating the first real dimension and a set of real dimensions extracted from the set of images into a digital container.

Methods for automatically generating a common measurement across multiple assembly units

An electronic device is provided with a display and a light sensor that receives light that passes through the display. The display includes features that increase the amount of light that passes through the display. The features may be translucency enhancement features that allow light to pass directly through the display onto a light sensor mounted behind the display or may include a light-guiding layer that guides light through the display onto a light sensor mounted along an edge of the display. The translucency enhancement features may be formed in a reflector layer or an electrode layer for the display. The translucency enhancement features may include microperforations in a reflector layer of the display, a light-filtering reflector layer of the display, or a reflector layer of the display that passes a portion of the light and reflects an additional portion of the light.

Electronic devices with light sensors and displays

Housing for an electronic device

A device including a mechanical input and a touch-sensitive surface for detecting one or more touch inputs and an input from the mechanical input. The touch-sensitive surface can include a first portion for detecting at least the touch inputs, and a second portion for detecting at least the mechanical input. The touch-sensitive surface can include a first portion for detecting at least the touch inputs and the mechanical input. The mechanical input can comprise an electrically conductive material, and the mechanical input can be detected based on capacitance measurements between the mechanical input and the touch-sensitive surface. The device can include a sensing element, the mechanical input can comprise an electrically insulating material, and the mechanical input can be detected based on capacitance measurements between the touch-sensitive surface and the sensing element. The device can include logic to differentiate between the touch inputs and the mechanical input.

Capacitive touch panel for sensing mechanical inputs to a device

One variation of an optical inspection kit includes: an enclosure defining an imaging volume; an optical sensor adjacent the imaging volume and defining a field of view directed toward the imaging volume; a nest module defining a receptacle configured to locate a surface of interest on a first unit of a first part within the imaging volume at an image plane of the optical sensor; a dark-field lighting module adjacent and perpendicular to the nest module and including a dark-field light source configured to output light across a light plane and a directional light filter configured to pass light output by the dark-field light source normal to the light plane and to reject light output by the dark-field light source substantially nonparallel to the light plane; and a bright-field light source proximal the optical sensor and configured to output light toward the surface of interest.

Modular optical inspection station

Growing community of inventors

Mountain View, CA, United States of America

Anna-Katrina Shedletsky