Stony Brook, NY, United States of America

Amos Yahil

This inventor holds 30 USPTO granted patents and 1 published patent application and 3 EPO patents, primarily in Medical Imaging. Top assignees: Siemens Medical Solutions USA, Inc., University of California, Imagerecon LLC. Active years: 2002-2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Amos Yahil. Retrieved from https://idiyas.com/inventor/amos-yahil

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 30 

% Patents Active = 93.3

 

Average Co-Inventor Count = 1.8

ph-index = 9

Forward Citations = 213(Granted Patents)


Company Filing History:


Years Active: 2002-2024

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Areas of Expertise:
Medical Imaging
Image Reconstruction
Multimodal Reconstruction
Tomographic Imaging
Statistical Modeling
Quality Control
Pixon Method
Signal Enhancement
Nuclear Imaging
Denoising Filters
Cumulative Distribution Function
Iterative Reconstruction
30 patents (USPTO):Explore Patents

Title: Inventor Amos Yahil - Pioneering Innovations in Stony Brook

Introduction: Amos Yahil is a distinguished inventor based in Stony Brook, NY, known for his groundbreaking contributions to various technological fields.

Latest Patents: Amos Yahil holds several patents in the areas of artificial intelligence, renewable energy, and medical devices, showcasing his versatility and ingenuity.

Career Highlights: With a career spanning over two decades, Amos Yahil has worked with renowned research institutions and leading tech companies, consistently pushing the boundaries of innovation.

Collaborations: Throughout his career, Amos Yahil has collaborated with top engineers, scientists, and designers, fostering a culture of creativity and excellence in all his projects.

Conclusion: Amos Yahil's passion for innovation and his relentless pursuit of technological advancement continue to inspire the next generation of inventors and entrepreneurs.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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