The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2014
Filed:
Apr. 16, 2012
Applicant:
Amos Yahil, Stony Brook, NY (US);
Inventor:
Amos Yahil, Stony Brook, NY (US);
Assignee:
ImageRecon LLC, Stony Brook, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for iterative reconstruction of an object containing noise using the pixon method determines the pixon map from a variable that is used to update the object in the iteration. The updating variable is based on an optimized merit function, and smoothes the updating variable during each iteration. The updating variable depends on the reconstruction method, but is typically a gradient of a merit function or a multiplicative update factor. The updated object can optionally also be further smoothed at the end of the iteration, using the pixon map determined during the iteration.