The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2018

Filed:

Sep. 18, 2014
Applicant:

Siemens Medical Solutions Usa, Inc., Malvern, PA (US);

Inventor:

Amos Yahil, Stony Brook, NY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); G06T 7/00 (2017.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06F 17/18 (2013.01); G06T 2207/10072 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/10104 (2013.01); G06T 2207/10108 (2013.01); G06T 2207/10116 (2013.01);
Abstract

A method and system are provided for constructing a model of a target object in a computer processor by receiving an input signal from a source, the input signal containing data describing the target object and a plurality of parameters, the input signal having a noise portion; selecting a group of initial parameters, estimating a nonparametric probability distribution function (pdf) comprising a linear combination of a set of square-integrable basis functions, computing a quadratic likelihood functional (QLF), evaluating a fit of the initial parameters to the data based on the QLF, iteratively optimizing the QLF by selecting a new group of parameters and evaluating the fit of the new group of parameters into a predetermined condition is achieved. Once an acceptable fit is achieved, an output of a model of the target object constructed using optimized parameters can be displayed.


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