The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2014
Filed:
Nov. 12, 2010
Alexander Hans Vija, Evanston, IL (US);
Amos Yahil, Stony Brook, NY (US);
Alexander Hans Vija, Evanston, IL (US);
Amos Yahil, Stony Brook, NY (US);
Siemens Medical Solutions USA, Inc., Malvern, PA (US);
Abstract
Methods and apparatuses for quality control in image space for processing with an input data set are disclosed. A method includes providing an image object, including multiple voxels, and an input data set. A data model is determined from the image object. A cumulative distribution function (CDF) for the input data set is determined from the data model and the input data set based on a plurality of projections. The CDF is transformed to an image cumulative distribution function (ICDF) in object space. The ICDF represents a number of standard deviations associated with each voxel of the image object. The output of the ICDF is displayed. A nuclear imaging system and a computer readable storage medium are also disclosed. Techniques disclosed herein facilitate efficient quality control for tomographic image reconstruction.