This inventor holds 9 USPTO granted patents and 3 published patent applications and 5 EPO patents. Top assignee: Rohde and Schwarz Gmbh & Co. Kg. Active years: 2011-2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Taufkirchen, DE (2011 - 2020)
- Munich, DE (2022)
Company Filing History:
Years Active: 2011-2026
Title: Innovations by Alexander Pabst
Introduction
Alexander Pabst is a notable inventor based in Taufkirchen, Germany. He has made significant contributions to the field of measurement systems, particularly in the context of radio frequency (RF) devices. With a total of 9 patents to his name, Pabst continues to push the boundaries of technology.
Latest Patents
Among his latest patents is a measurement system designed for performing measurements of the total radiated power of a device under test. This innovative system includes an anechoic chamber, a positioner for supporting the device under test, and various measurement antennas. These antennas are strategically arranged to facilitate accurate total radiated power measurements. Another notable patent involves a measurement system for RF devices, which comprises multiple signal generators and probes, allowing for precise signal measurement through a controllable positioner.
Career Highlights
Pabst is currently employed at Rohde & Schwarz GmbH & Co. KG, a leading company in the field of electronic test and measurement. His work has been instrumental in developing advanced measurement technologies that enhance the performance and reliability of RF devices.
Collaborations
Throughout his career, Pabst has collaborated with talented individuals such as Christina Gessner and Adam Tankielun. These partnerships have contributed to the successful development of innovative measurement solutions.
Conclusion
Alexander Pabst's contributions to measurement technology exemplify the spirit of innovation. His patents reflect a commitment to advancing the field and improving the accuracy of RF device measurements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
