The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2018
Filed:
Jun. 14, 2017
Rohde & Schwarz Gmbh & Co. KG, München, DE;
Alexander Pabst, Taufkirchen, DE;
Corbett Rowell, München, DE;
ROHDE & SCHWARZ GMBH & CO. KG, München, DE;
Abstract
A test system for testing a device under test comprising an antenna array with multiple antennas and capable of controlling a radiation pattern of the antenna array, may comprise a test antenna system for emitting outgoing test signals to the device under test and receiving incoming test signals from the device under test, a control unit for controlling the device under test to set a first radiation pattern with a theoretical main lobe pointing to the test antenna system or to set a second radiation pattern with a main lobe comprising an angle larger than 0° with the main lobe of the first radiation pattern, and a test processing unit for evaluating the device under test based on signal levels of incoming test signals received by the test antenna system from the device under test and/or based on signal levels of outgoing test signals as received by the device under test.