The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2019
Filed:
Jan. 24, 2017
Applicant:
Rohde & Schwarz Gmbh & Co. KG, München, DE;
Inventor:
Alexander Pabst, Taufkirchen, DE;
Assignee:
ROHDE & SCHWARZ GMBH & CO. KG, Munich, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/29 (2015.01); H04B 17/10 (2015.01); G01R 29/08 (2006.01); H04B 17/00 (2015.01); H04B 17/318 (2015.01);
U.S. Cl.
CPC ...
H04B 17/103 (2015.01); G01R 29/0878 (2013.01); H04B 17/0085 (2013.01); H04B 17/29 (2015.01); H04B 17/318 (2015.01);
Abstract
A measurement system for measuring signals in a RF device comprises at least two signal generators for generating a test signal in each one of the signal generators, a probe for every signal generator, each probe being connected to the respective signal generator for emitting the respective test signal to the RF device, and a controllable positioner for rotatably positioning the RF device with respect to the probes.
Pabst, Alexander. (2019). Measurement system and a method (U.S. Patent No. 10404385). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10404385
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