Cedar Park, TX, United States of America

Abel Alaniz


Average Co-Inventor Count = 4.0

ph-index = 2

Forward Citations = 15(Granted Patents)


Location History:

  • Cedar Park, TX (US) (2011)
  • Austin, TX (US) (2011)

Company Filing History:


Years Active: 2011

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3 patents (USPTO):Explore Patents

Title: Innovations by Inventor Abel Alaniz

Introduction

Abel Alaniz is a notable inventor based in Cedar Park, TX (US). He has made significant contributions to the field of electronic circuit testing, holding a total of 3 patents. His work focuses on developing methods that enhance the reliability and efficiency of electronic systems.

Latest Patents

Abel Alaniz's latest patents include innovative methods for testing electronic circuits. One of his patents, titled "Method and system for LBIST testing of an electronic circuit," describes a process that involves selecting specific log intervals and patterns to test an electronic circuit. This method generates associated outputs and compares them with known outputs to identify any mismatches. Another patent, "Method and system for testing an electronic circuit to identify multiple defects," outlines a procedure for applying a range of test patterns to an electronic circuit, allowing for the identification of defects through careful comparison of outputs.

Career Highlights

Abel Alaniz is currently employed at International Business Machines Corporation (IBM), where he continues to innovate in the field of electronic testing. His work has contributed to advancements in circuit reliability and performance, making him a valuable asset to his team and the industry.

Collaborations

Throughout his career, Abel has collaborated with talented individuals such as Asher Shlomo Lazarus and Benjamin Robert Gass. These collaborations have fostered a creative environment that encourages the development of groundbreaking technologies.

Conclusion

Abel Alaniz is a distinguished inventor whose work in electronic circuit testing has led to several important patents. His contributions to the field continue to influence the development of reliable electronic systems.

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