The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2011
Filed:
Jun. 30, 2008
Applicants:
Abel Alaniz, Austin, TX (US);
Robert B. Gass, Pflugerville, TX (US);
Asher S. Lazarus, Austin, TX (US);
Timothy M. Skergen, Austin, TX (US);
Inventors:
Abel Alaniz, Austin, TX (US);
Robert B. Gass, Pflugerville, TX (US);
Asher S. Lazarus, Austin, TX (US);
Timothy M. Skergen, Austin, TX (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/02 (2006.01); G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method, system and computer program product for performing device characterization Logic Built-In Self-Test (LBIST) in an IC device. Test parameters of the LBIST are saved in a memory of the IC device, and nominal operational parameters of the IC device are used to define a signature of the LBIST. A determination whether the LBIST is passed or failed is made within the characterized IC device.