The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2011
Filed:
May. 20, 2008
Benjamin Robert Gass, Pflugerville, TX (US);
Abel Alaniz, Cedar Park, TX (US);
Asher Shlomo Lazarus, Austin, TX (US);
Timothy M. Skergan, Austin, TX (US);
Benjamin Robert Gass, Pflugerville, TX (US);
Abel Alaniz, Cedar Park, TX (US);
Asher Shlomo Lazarus, Austin, TX (US);
Timothy M. Skergan, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for testing an electronic circuit comprises selecting a first log interval, a first log start pattern, a first log end pattern, and a first subset range of LBIST patterns from a plurality of LBIST patterns arranged in an order, wherein each LBIST pattern of the subset range of LBIST patterns causes an associated output of an electronic circuit. The method tests an electronic circuit in a first test by applying to the electronic circuit the first subset range of LBIST patterns sequentially in the order, thereby generating a first plurality of associated outputs. The method stores a first subset of associated outputs based on the first log interval, the first log start pattern, and the first log end pattern. The method compares the subset of associated outputs with known outputs to identify a first output mismatch.