The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2011
Filed:
May. 20, 2008
Benjamin Robert Gass, Pflugerville, TX (US);
Abel Alaniz, Cedar Park, TX (US);
Asher Shlomo Lazarus, Austin, TX (US);
Timothy M. Skergan, Austin, TX (US);
Benjamin Robert Gass, Pflugerville, TX (US);
Abel Alaniz, Cedar Park, TX (US);
Asher Shlomo Lazarus, Austin, TX (US);
Timothy M. Skergan, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for testing an electronic circuit comprises selecting a plurality of test patterns arranged in an order. The method tests an electronic circuit by applying to the electronic circuit a first subset range of the plurality of test patterns sequentially in the order, from a first test pattern to a first log interval after the first test pattern, thereby generating a first associated output. The method compares the first associated output with a first known output of the plurality of known outputs. In the event the first associated output does not match the first known output, the method stores indicia of the first mismatch; causes the electronic circuit to appear to assume the first known output state; and proceeds with additional test procedures.