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Hamburg, Germany

Yxlon International Gmbh

USPTO Granted Patents = 17

% Expired Patents = 35.3

EPO Patents = 5

Trademarks = 3

Forward Citations = 57

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27 inventors (with patents filed for the assignee):

Klaus Bavendiek (4 out of 7 patents)

Martin Muenker (3 out of 3 patents)

Thomas Wenzel (2 out of 9 patents)

4. Jeremy Simon (2 out of 2 patents)

5. Frank Herold (1 out of 2 patents)

6. Philipp Klein (1 out of 2 patents)

7. Sarajaddin Rahmani (1 out of 1 patent)

8. Lothar Schultheis (1 out of 2 patents)

9. Bjoern Schrader (1 out of 1 patent)

10. Karsten Koch (1 out of 1 patent)

11. Keith Bryant (1 out of 1 patent)

12. Bernhard Murkens (1 out of 1 patent)

13. Mathias Wientapper (1 out of 1 patent)

14. André Schu (1 out of 1 patent)

15. Frank Bogumil (1 out of 1 patent)

17 patents: Sort by Forward Citations

1. 11651482 - Method for obtaining at least one significant feature in a series of components of the same type and method for the classification of a component of such a series (2023-05-16),

2. 10964073 - Method for the reconstruction of a test part in an X-ray CT method in an X-ray CT system by means of an intelligent path curve (2021-03-30),

3. 10840053 - Receptacle for receiving a plug connector of a high-voltage cable for a microfocus X-ray tube, plug connection for a high-voltage cable (2020-11-17),

4. 10825162 - Method for obtaining information from X-ray computed tomography data for optimizing the injection-moulding process of short-fibre-reinforced plastic parts (2020-11-03),

5. 10739279 - Method for checking the location of elements in a tire in an X-ray inspection system, X-ray inspection system for carrying out such a method as well as use of such an X-ray inspection system for carrying out such method (2020-08-11),

6. 10712291 - Detector with reduced-size edge pixel elements (2020-07-14),

7. 10571413 - Method for checking an electronic component (2020-02-25),

8. 10504633 - Diaphragm for an X-ray tube and X-ray tube with such a diaphragm (2019-12-10),

9. 10495586 - Apparatus for nondestructive material testing of objects (2019-12-03),

10. 10209204 - X-ray inspection system and method for rotating a test object by means of such an X-ray inspection system (2019-02-19),

11. 9772259 - Method for calibrating an X-ray testing system for a tire type and method for checking the position of cords in a tire (2017-09-26),

12. 9372270 - X-ray line detector and method for the production thereof (2016-06-21),

13. 9322936 - X-ray line detector (2016-04-26),

14. 9322789 - Method for feeding X-ray fluoroscopy images in the context of a digital laminography technique and use of a multiaxis manipulator system for carrying out said method (2016-04-26),

15. 8774349 - Device and method for non-destructively testing cylindrical or tube-shaped test objects by means of X-rays (2014-07-08),

Company Overview

Yxlon International GmbH, based in Hamburg, specializes in advanced X-ray and computed tomography systems. The company focuses on providing innovative solutions for non-destructive testing and inspection across various industries, including aerospace, automotive, and electronics. Yxlon's technology enhances quality assurance and safety by enabling detailed internal examinations of components and materials. With a commitment to precision and reliability, Yxlon plays a crucial role in supporting industries that demand high standards of integrity and performance.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

17 Patents

#59 in Hamburg

#2,497 in Germany

#35,948 in the World

Hamburg, Germany

Yxlon International Gmbh

Forward Citations = 57

27 inventors:

Klaus Bavendiek (4 out of 7 patents)

Martin Muenker (3 out of 3 patents)

Thomas Wenzel (2 out of 9 patents)

4. Jeremy Simon (2 out of 2 patents)

5. Frank Herold (1 out of 2 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Yxlon International Gmbh. Retrieved from https://idiyas.com/company/yxlon-international

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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