The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2020
Filed:
Apr. 16, 2019
Yxlon International Gmbh, Hamburg, DE;
Thomas Wenzel, Hamburg, DE;
Jeremy Simon, Ann Arbor, MI (US);
YXLON INTERNATIONAL GMBH, Hamburg, DE;
Abstract
Method for obtaining information from short-fibre-reinforced plastic components sequentially produced by an X-ray computed tomography. A learning phase includes: generating CT data sets for a random sample of plastic components from a production process; extracting at least one defect-free region of the plastic components; determining characteristic feature(s) in the extracted regions, relevance of individual features, and regions which are characteristic of the plastic component type and production process thereof, over a predetermined period of the plastic components productions, which exhibit considerable characteristic differences between good parts and reject parts; and defining the feature(s) with its characteristic as trained classifier. An application phase includes: generating a CT data set of the plastic component for inspection; classifying the inspection part based on the trained classifier; examining the characteristic of the feature(s) for a negative trend; and automatically provide a negative trend alert and/or change process parameters to counteract the negative trend.