The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2019
Filed:
Oct. 21, 2014
Applicant:
Yxlon International Gmbh, Hamburg, DE;
Inventors:
Assignee:
YXLON INTERNATIONAL GMBH, Hamburg, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/00 (2006.01); G01N 23/046 (2018.01); G01N 23/04 (2018.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); G01N 23/04 (2013.01); G01N 2223/309 (2013.01); G01N 2223/3303 (2013.01); G01N 2223/3306 (2013.01); G01N 2223/3308 (2013.01); G01N 2223/419 (2013.01);
Abstract
An X-ray inspection system includes an X-ray source and a detector. A rotary table is arranged between the X-ray source and the detector. The rotary table is configured to secure a test object on the rotary table. The rotary table is arranged on a positioning table. The positioning table is configured to move parallel to an xy-plane between the X-ray source and the detector. The xy-plane is perpendicular to a surface of the detector extending parallel to the xz-plane and the rotary table is configured to rotate about a z-axis.