Hamburg, Germany

Axel Klein

This inventor holds 1 USPTO granted patent and 1 published patent application and 2 EPO patents. Top assignee: Yxlon International Gmbh. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Axel Klein. Retrieved from https://idiyas.com/inventor/axel-klein-kr1l7srn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 15(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Axel Klein - Innovator in X-ray Inspection Technology

Introduction

Axel Klein is a notable inventor based in Hamburg, Germany. He has made significant contributions to the field of X-ray inspection technology. His innovative approach has led to the development of a unique system that enhances the efficiency of inspecting test objects.

Latest Patents

Axel Klein holds a patent for an X-ray inspection system and method for rotating a test object. This system includes an X-ray source and a detector, with a rotary table positioned between them. The rotary table is designed to secure a test object and is mounted on a positioning table that moves parallel to an xy-plane. This configuration allows for precise rotation about a z-axis, improving the inspection process.

Career Highlights

Throughout his career, Axel Klein has worked with prominent companies in the industry. He has been associated with Yxlon International GmbH and Comet Xylon GmbH, where he has contributed to advancements in X-ray technology. His work has been instrumental in developing systems that enhance inspection capabilities.

Collaborations

Axel Klein has collaborated with talented professionals in his field, including Andreas Mecke and Jan Spalding. These collaborations have fostered innovation and have led to the successful development of advanced inspection technologies.

Conclusion

Axel Klein's contributions to X-ray inspection technology demonstrate his commitment to innovation and excellence. His patent and career achievements reflect his expertise and dedication to improving inspection methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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