The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2020
Filed:
Apr. 26, 2018
Yxlon International Gmbh, Hamburg, DE;
Karsten Koch, Ammersbek, DE;
YXLON INTERNATIONAL GMBH, Hamburg, DE;
Abstract
A method for checking the location of elements in a tire in an X-ray inspection system. The X-ray inspection system has an X-ray tube, a linear X-ray detector and a manipulator. The method includes: using a three-dimensional model of the tire, in which potential locations of the elements in the tire are described; recording two-dimensional X-ray line images of the tire elements consisting of pixels, which are described by a vector from the X-ray tube through the element to the X-ray detector; allocation of the pixels of an element from the two-dimensional X-ray line image to the three-dimensional model of the tire, in that the intersection point of a straight line through the X-ray tube with the vector of the pixel from the two-dimensional X-ray line image is assigned with the potential location of the element of the three-dimensional model as a point in the space for the pixel.