For the Inventor, By the Inventor

Enter assignee name

Norwood, MA, United States of America

Xcerra Corporation

USPTO Granted Patents = 33

% Expired Patents = 9.1

EPO Patents = 7

Trademarks = 6

Forward Citations = 51

Loading Chart...

Loading Chart...

56 inventors (with patents filed for the assignee):

Jason Mroczkowski (9 out of 10 patents)

Yukang Feng (6 out of 6 patents)

Valts Edgars Treibergs (6 out of 15 patents)

4. William A Fritzsche (5 out of 14 patents)

5. Russell Elliott Poffenberger (5 out of 5 patents)

6. Timothy Alton (4 out of 6 patents)

7. Victor Landa (4 out of 7 patents)

8. James Hattis (4 out of 4 patents)

9. Mitchell Nelson (3 out of 3 patents)

10. Jeffery D Currin (3 out of 3 patents)

11. Michael Gordon Davis (3 out of 4 patents)

12. Nadia Steckler (3 out of 3 patents)

13. Dongmei Han (2 out of 3 patents)

14. Travis Evans (2 out of 2 patents)

15. Bernd-Ulrich Ott (2 out of 2 patents)

Core Competencies:

Test Socket Assembly

RF Circuit

Calibration System

Probe Assembly

Dielectric Resonator

Automated Test Platform

Integrated Circuit Tester

Wiring Board

Heat Dissipation

Distortion Measurement

Coaxial Probe

Hybrid Probe Head

33 patents: Sort by Forward Citations

1. 12710448 - REPLACEABLE INSULATOR COLLARS FOR SEMICONDUCTOR TEST SYSTEMS (2026-08-18),

2. 12498395 - System and method for attenuating and/or terminating RF circuit (2025-12-16),

3. 12334988 - Reflective and interference controlled absorptive contactor (2025-06-17),

4. 12123897 - Dielectric resonating test contactor and method (2024-10-22),

5. 12111343 - Coaxial probe (2024-10-08),

6. 12044726 - Calibration system (2024-07-23),

7. 11662363 - Test socket assembly with antenna and related methods (2023-05-30),

8. 11650227 - System and method for attenuating and/or terminating RF circuit (2023-05-16),

9. 11391765 - Test socket assembly with waveguide antenna probe (2022-07-19),

10. 11268981 - Spring-loaded probe having folded portions and probe assembly (2022-03-08),

11. 11088051 - Test socket assembly and related methods (2021-08-10),

12. 11061065 - Testing device and method for testing a printed circuit board (2021-07-13),

13. 11041881 - Hybrid probe head assembly for testing a wafer device under test (2021-06-22),

14. 10444278 - Testing system and method (2019-10-15),

15. 10379154 - Testing system and method (2019-08-13),

Company Overview

Xcerra Corporation, based in Norwood, MA, specializes in providing advanced test and measurement solutions for the semiconductor industry. The company develops a range of innovative technologies aimed at enhancing the efficiency and effectiveness of semiconductor manufacturing processes. Xcerra's expertise encompasses various domains, including automated test equipment and systems integration, catering to the evolving needs of electronics manufacturers globally. Their commitment to quality and innovation positions them as a key player in the semiconductor testing landscape.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

33 Patents

#4 in Norwood, MA

#619 in Massachusetts

#10,309 in US

#20,162 in the World

Norwood, MA, United States of America

Xcerra Corporation

Forward Citations = 51

56 inventors:

Jason Mroczkowski (9 out of 10 patents)

Yukang Feng (6 out of 6 patents)

Valts Edgars Treibergs (6 out of 15 patents)

4. William A Fritzsche (5 out of 14 patents)

5. Russell Elliott Poffenberger (5 out of 5 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Xcerra Corporation. Retrieved from https://idiyas.com/company/xcerra

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

Loading…