The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2024
Filed:
Dec. 18, 2020
Applicant:
Xcerra Corporation, Norwood, MA (US);
Inventors:
James Hattis, St. Paul, MN (US);
Travis Evans, St. Paul, MN (US);
Waqas Muzammil, St. Paul, MN (US);
Yukang Feng, St. Paul, MN (US);
Jason Mroczkowski, St. Paul, MN (US);
Marty Cavegn, St. Paul, MN (US);
Assignee:
Xcerra Corporation, Norwood, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); G01R 1/02 (2006.01); G01R 1/04 (2006.01); G01R 1/073 (2006.01); G01R 31/26 (2020.01); G01R 31/28 (2006.01); H01R 13/22 (2006.01); H01R 13/405 (2006.01);
U.S. Cl.
CPC ...
G01R 1/067 (2013.01); G01R 31/2886 (2013.01); H01R 13/22 (2013.01); H01R 13/405 (2013.01);
Abstract
A test contactor is disclosed. The test contactor includes two or more dielectric layers and a test probe embedded in the one or more dielectric layers. The test contactor traverses the one or more dielectric layers. The test probe to include an input signal port and an output signal port and the test probe to transmit a test signal from the input signal port to the output signal port.