Amsterdam, Netherlands

Smartrac I.p. B.v.

USPTO Granted Patents = 35

% Expired Patents = 34.3



Trademarks = 3

Forward Citations = 267

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29 inventors (with patents filed for the assignee):

goldMedal Manfred Rietzler (14 out of 71 patents)

silverMedal Raymond Freeman (6 out of 8 patents)

bronzeMedal Oded Bashan (5 out of 35 patents)

4.  Guy Shafran (5 out of 8 patents)

5.  Juhani Virtanen (5 out of 7 patents)

6.  Tuomas Koskelainen (4 out of 5 patents)

7.  Manfred Michalk (2 out of 9 patents)

8.  Kaj Nummila (1 out of 7 patents)

9.  Martin Kuschewski (1 out of 1 patent)

10.  Kaarle Jaakkola (1 out of 10 patents)

11.  Matti Tavilampi (1 out of 1 patent)

12.  Ulrich Lang (1 out of 1 patent)

13.  Miika Huusko (1 out of 1 patent)

14.  Heikki Seppä (1 out of 28 patents)

15.  Juha Vattulainen (1 out of 2 patents)


Core Competencies:
Transponder
RFID
Antenna Element
Electronic Interface
Data Storage
Tamper Protection
Smartcard
Inlay Structure
Manufacturing
Layered Composite
Circuit Configuration
Environment Measurements

35 patents:

Company Overview
Smartrac I.p. B.v., headquartered in Amsterdam, specializes in the development and manufacturing of advanced RFID and IoT solutions. The company focuses on creating innovative products that enhance connectivity and data management across various industries, including retail, logistics, and healthcare. With a strong emphasis on research and technology, Smartrac aims to deliver cutting-edge solutions that improve operational efficiency and enable smarter decision-making for its clients globally.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

Smartrac I.p. B.v. USPTO Patent Assignee Logo
35 Patents

#21 in Amsterdam

#227 in Netherlands

#19,181 in the World

Amsterdam, NL
Amsterdam, Netherlands
Forward Citations = 267

29 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Smartrac I.p. B.v.. Retrieved from https://idiyas.com/company/smartrac-i-p-b-v

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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