Espoo, Finland

Silecs Oy


USPTO Granted Patents = 24

% Expired Patents = 33.3


Forward Citations = 113

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19 inventors (with patents filed for the assignee):

goldMedal Juha T Rantala (17 out of 38 patents)

silverMedal Arto L T Maaninen (9 out of 9 patents)

bronzeMedal Jyri Paulasaari (7 out of 11 patents)

4.  Jarkko J Pietikainen (7 out of 7 patents)

5.  Jason S Reid (7 out of 20 patents)

6.  Tiina Maaninen (6 out of 9 patents)

7.  Nungavram S Viswanathan (6 out of 6 patents)

8.  T Teemu T Tormanen (6 out of 6 patents)

9.  Juha A Rantala (3 out of 3 patents)

10.  Janne Kylmä (2 out of 8 patents)

11.  Jarkko Pietikäinen (2 out of 2 patents)

12.  William McLaughlin (1 out of 3 patents)

13.  Nigel Hackera (1 out of 1 patent)

14.  Nina Pirilä (1 out of 1 patent)

15.  Turo T Törmänen (1 out of 1 patent)


24 patents:

Company Overview
Silecs Oy is a Finnish technology company specializing in advanced materials for the semiconductor industry. The company focuses on developing innovative solutions that enhance the performance and efficiency of electronic devices. Silecs is known for its expertise in silicon-based materials, which are crucial for various applications in microelectronics and photonics. With a commitment to research and development, Silecs aims to drive advancements in technology, contributing to the evolution of high-performance electronic systems.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 13 2026

Silecs Oy USPTO Patent Assignee Logo
24 Patents

#32 in Espoo

#146 in Finland

#26,660 in the World

Espoo, FI
Espoo, Finland
Forward Citations = 113

19 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Silecs Oy. Retrieved from https://idiyas.com/company/silecs-oy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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