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Trademarks = 1

Forward Citations = 35

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10 inventors (with patents filed for the assignee):

Yoshihiro Akiyama (5 out of 8 patents)

Yosuke Yamamoto (3 out of 9 patents)

Takuma Hirayama (3 out of 3 patents)

4. Atsushi Kitabatake (2 out of 2 patents)

5. Takahiko Wada (1 out of 2 patents)

6. Yong Yang (1 out of 1 patent)

7. Sakie Akiyama (1 out of 1 patent)

8. Yukio Iwano (1 out of 1 patent)

9. Hiroyuki Murata (1 out of 9 patents)

10. Yuichiro Yoshida (1 out of 1 patent)

10 patents: Sort by Forward Citations

1. 12379334 - Inspection device (2025-08-05),

2. 12228527 - Inspection device (2025-02-18),

3. 11835475 - Inspection position identification method, three-dimensional image generation method, and inspection device (2023-12-05),

4. 11422099 - Inspection position identification method, three-dimensional image generation method, and inspection device (2022-08-23),

5. 9084386 - Inspection of ball grid array soldering with boundary detection using tomographic artifact (2015-07-14),

6. 7751611 - Apparatus for inspecting appearance of inspection piece (2010-07-06),

7. 7590279 - Appearance inspection apparatus for inspecting inspection piece (2009-09-15),

8. 7221443 - Appearance inspection apparatus and method of image capturing using the same (2007-05-22),

9. 7002676 - Appearance inspection apparatus and the method of inspecting the same (2006-02-21),

10. 6560024 - Scan head, an appearance inspection method and an appearance inspection apparatus using the same (2003-05-06),

Saki Corporation is a prominent technology company based in Tokyo, Japan, specializing in advanced inspection and measurement solutions for the electronics manufacturing sector. The company focuses on developing high-precision automated optical inspection systems that enhance quality control processes in production lines. With a commitment to innovation, Saki Corporation plays a crucial role in improving manufacturing efficiency and product reliability, catering to a global clientele in the electronics industry.

Profile summary based on public USPTO records.