The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2026

Filed:

Jul. 20, 2023
Applicant:

Saki Corporation, Tokyo, JP;

Inventors:

Hideaki Tanaka, Tokyo, JP;

Tatsuyuki Matsuura, Tokyo, JP;

Assignee:

SAKI CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01); G01B 11/06 (2006.01); G01N 21/88 (2006.01); G01N 21/956 (2006.01);
U.S. Cl.
CPC ...
G01B 11/254 (2013.01); G01B 11/0608 (2013.01); G01N 21/95684 (2013.01); G01N 21/8806 (2013.01); G01N 2021/95638 (2013.01); G01N 2021/95653 (2013.01);
Abstract

An inspection device includes: a first image unit that captures an image of an inspection object from a vertical direction; a plurality of dome-shaped reflector plates being arranged between the first image unit and the inspection object and having aperture parts on a side of the first image unit and a side of the inspection object, respectively; a plurality of annular light sources that illuminate the respective reflector plates; and apparatuses for inspection (second image unit and projection unit) that are provided outside of the reflector plates and are capable of capturing an image of the inspection objector irradiating the inspection object with light. Optical axes of the apparatuses for inspection are arranged so as to pass through through-holes provided in the reflector plates.


Find Patent Forward Citations

Tanaka, Hideaki. (2026). Inspection device (U.S. Patent No. 12774885). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12774885

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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