The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2007

Filed:

Jan. 23, 2004
Applicant:

Yoshihiro Akiyama, Kanagawa-ken, JP;

Inventor:

Yoshihiro Akiyama, Kanagawa-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G02B 27/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention is an appearance inspection apparatus and method utilizing multiple light sources in a lighting unitto alternately irradiate, line by line, side light from a side light source and slit light from a slit light source onto boardto be inspected. A correction value memory unit stores digital correction values required for correcting shadings for the side light source and the slit light source and an analysis unit utilizes these digital correction values to correct shadings on the image data. A highly accurate image is thus obtained.


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