Quest Metrology, LLC

Calculating rank

USPTO Granted Patents = 7

% Expired Patents = 57.1

EPO Patents = 1

Trademarks = 1

Forward Citations = 16

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7 inventors (with patents filed for the assignee):

Phillip Dewayne Bondurant (5 out of 21 patents)

Christian Robert Lentz (4 out of 7 patents)

David William Rook (4 out of 6 patents)

4. David H Bothell (4 out of 5 patents)

5. David Jack Savage (4 out of 4 patents)

6. Stanley P Johnson (3 out of 10 patents)

7. Lawrence J Zagorsky (2 out of 5 patents)

7 patents: Sort by Forward Citations

1. 10036629 - Optical thread profiler (2018-07-31),

2. 9638517 - Optical thread profiler (2017-05-02),

3. 9234748 - Optical thread profiler (2016-01-12),

4. 8860952 - Optical thread profiler (2014-10-14),

5. 8164758 - Internal inspection system and method (2012-04-24),

6. 8039827 - Apparatus and methods for measuring at least one physical characteristic of a threaded object (2011-10-18),

7. 8035094 - Methods for measuring at least one physical characteristic of a component (2011-10-11),

Company Overview

Quest Metrology, LLC is a leading provider of metrology solutions, offering a wide range of equipment and services for measurement and inspection needs. With over 20 years of experience in the industry, we strive to deliver high-quality products and exceptional customer service to help our clients achieve their measurement goals.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Nov 3 2026

7 Patents

#25 in Kent, WA

#930 in Washington

#39,974 in US

Kent, WA, United States of America

Quest Metrology, LLC

Forward Citations = 16

7 inventors:

Phillip Dewayne Bondurant (5 out of 21 patents)

Christian Robert Lentz (4 out of 7 patents)

David William Rook (4 out of 6 patents)

4. David H Bothell (4 out of 5 patents)

5. David Jack Savage (4 out of 4 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Quest Metrology, LLC. Retrieved from https://idiyas.com/company/quest-metrology

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]