The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2012
Filed:
Jul. 10, 2009
Applicants:
Stanley P. Johnson, Avon, CT (US);
Phillip D. Bondurant, Covington, WA (US);
Inventors:
Stanley P. Johnson, Avon, CT (US);
Phillip D. Bondurant, Covington, WA (US);
Assignee:
Quest Metrology, LLC, Kent, WA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract
In some embodiments, an inspection system for measuring at least a portion of the threaded surface of an internally threaded component includes at least one measuring probe, a component retention device that allows positioning of the internally threaded component relative to the measuring probe and a processing device in signal communication with the measuring probe to receive threaded surface data therefrom.
Quick Actions:
Johnson, Stanley. (2012). Internal inspection system and method (U.S. Patent No. 8164758). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8164758
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile