Lawrence J Zagorsky

Title: Lawrence J Zagorsky: Innovator in Non-Contact Inspection Systems

Introduction

Lawrence J Zagorsky is a notable inventor based in Lincoln, RI (US), recognized for his contributions to the field of inspection systems. With a total of five patents to his name, Zagorsky has made significant advancements in non-contact measurement technologies.

Latest Patents

Zagorsky's latest patents include a Non-Contact Component Inspection System, which is designed to measure the physical characteristics of components using an electromagnetic radiation source. This system features a sensing device that generates data based on the silhouette created when a component blocks a portion of the electromagnetic radiation. Another notable patent is for an apparatus and methods for measuring at least one physical characteristic of a threaded object. This inspection system utilizes a collimated light source and a positioning device to accurately assess the characteristics of objects retained within a retention mount.

Career Highlights

Throughout his career, Zagorsky has worked with various companies, including Quest Metrology, LLC. His innovative work has positioned him as a key figure in the development of advanced inspection technologies.

Collaborations

Zagorsky has collaborated with professionals in his field, including his coworker Stanley P Johnson, to further enhance the capabilities of inspection systems.

Conclusion

Lawrence J Zagorsky's contributions to non-contact inspection technologies have established him as a prominent inventor in his field. His patents reflect a commitment to innovation and precision in measurement systems.