Company Filing History:
2 out of 7 
1 out of 1 
1 out of 2 Years Active: 2010-2013
Title: Lawrence J Zagorsky: Innovator in Non-Contact Inspection Systems
Introduction
Lawrence J Zagorsky is a notable inventor based in Lincoln, RI (US), recognized for his contributions to the field of inspection systems. With a total of five patents to his name, Zagorsky has made significant advancements in non-contact measurement technologies.
Latest Patents
Zagorsky's latest patents include a Non-Contact Component Inspection System, which is designed to measure the physical characteristics of components using an electromagnetic radiation source. This system features a sensing device that generates data based on the silhouette created when a component blocks a portion of the electromagnetic radiation. Another notable patent is for an apparatus and methods for measuring at least one physical characteristic of a threaded object. This inspection system utilizes a collimated light source and a positioning device to accurately assess the characteristics of objects retained within a retention mount.
Career Highlights
Throughout his career, Zagorsky has worked with various companies, including Quest Metrology, LLC. His innovative work has positioned him as a key figure in the development of advanced inspection technologies.
Collaborations
Zagorsky has collaborated with professionals in his field, including his coworker Stanley P Johnson, to further enhance the capabilities of inspection systems.
Conclusion
Lawrence J Zagorsky's contributions to non-contact inspection technologies have established him as a prominent inventor in his field. His patents reflect a commitment to innovation and precision in measurement systems.