The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2010
Filed:
Aug. 12, 2006
Stanley P. Johnson, Simsbury, CT (US);
Lawrence J. Zagorsky, Lincoln, RI (US);
Stanley P. Johnson, Simsbury, CT (US);
Lawrence J. Zagorsky, Lincoln, RI (US);
Other;
Abstract
An inspection system and a method for measuring physical characteristics of a component using the inspection system is provided, wherein the inspection system includes a light source, a sensing device, a reflecting device, and a retention mount, at least one of which is movably associated with the inspection system. The method includes associating a component with the inspection system, operating the inspection system to cause the light source to emit a collimated light beam propagating along a source optical path, reflecting the collimated light beam via the reflecting device to cause a reflected collimated light beam to be incident upon the component to produce a component silhouette which is incident upon the sensing device, generating image data responsive to the component silhouette and processing the image data to generate resultant data comprising at least one of a plurality of physical characteristics of the component.