Quest Metrology Group, LLC

Calculating rank

USPTO Granted Patents = 2

% Expired Patents = 100.0

Trademarks = 1

Forward Citations = 3

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2 inventors (with patents filed for the assignee):

Stanley P Johnson (2 out of 10 patents)

Lawrence J Zagorsky (1 out of 5 patents)

2 patents: Sort by Forward Citations

1. 8410466 - Non-contact component inspection system (2013-04-02),

2. 8171611 - Method for implementing a component positioning device (2012-05-08),

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USPTO Data Jan 1 1976 - Nov 3 2026

2 Patents

#65 in Kent, WA

#2,348 in Washington

#95,021 in US

Kent, WA, United States of America

Quest Metrology Group, LLC

Forward Citations = 3

2 inventors:

Stanley P Johnson (2 out of 10 patents)

Lawrence J Zagorsky (1 out of 5 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Quest Metrology Group, LLC. Retrieved from https://idiyas.com/company/quest-metrology-group

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]