The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2018
Filed:
Mar. 22, 2017
Quest Metrology, Llc, Kent, WA (US);
Phillip Dewayne Bondurant, Covington, WA (US);
David William Rook, Kent, WA (US);
David H. Bothell, Lake Tapps, WA (US);
Christian Robert Lentz, Benton City, WA (US);
David Jack Savage, Renton, WA (US);
Quest Metrology, LLC, Kent, WA (US);
Abstract
An apparatus configured to measure at least one physical characteristic of a threaded surface (e.g., an internally threaded surface) of an object is provided. The apparatus uses optical triangulation to perform non-contact characterization of the threaded surface. The apparatus can be used to characterize various aspects of the threaded surface, including generating the measurements required to produce a longitudinal cross-sectional profile of the threaded surface.