For the Inventor, By the Inventor

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Seoul, South Korea

Nanofocus Inc.

USPTO Granted Patents = 3

Forward Citations = 4

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11 inventors (with patents filed for the assignee):

Jae Wan Hong (3 out of 7 patents)

Won Young Song (2 out of 3 patents)

Yu Sin Yang (1 out of 8 patents)

4. Chung Sam Jun (1 out of 6 patents)

5. Joon Lyou (1 out of 2 patents)

6. Jin Ho Choi (1 out of 6 patents)

7. Sang Kil Lee (1 out of 8 patents)

8. Jeong Hoi Kim (1 out of 1 patent)

9. Sang Jung Ahn (1 out of 7 patents)

10. Byong Chon Park (1 out of 5 patents)

11. Ki Young Jung (1 out of 1 patent)

3 patents: Sort by Forward Citations

1. 10222414 - Apparatus and method for exchanging probe (2019-03-05),

2. 8434159 - AFM measuring method and system thereof (2013-04-30),

3. 8153338 - Apparatus and method for repairing photo mask (2012-04-10),

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USPTO Data Jan 1 1976 - Dec 9 2025

3 Patents

#856 in Seoul

#2,641 in South Korea

Seoul, South Korea

Nanofocus Inc.

Forward Citations = 4

11 inventors:

Jae Wan Hong (3 out of 7 patents)

Won Young Song (2 out of 3 patents)

Yu Sin Yang (1 out of 8 patents)

4. Chung Sam Jun (1 out of 6 patents)

5. Joon Lyou (1 out of 2 patents)

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