Molecular Vista, Inc.

Calculating rank

USPTO Granted Patents = 4

EPO Patents = 1

Forward Citations = 2

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7 inventors (with patents filed for the assignee):

Thomas R Albrecht (4 out of 167 patents)

Derek Nowak (2 out of 2 patents)

Sung I Park (2 out of 2 patents)

4. Junghoon Jahng (1 out of 1 patent)

5. Eun Seong Lee (1 out of 6 patents)

6. Josh Gioja (1 out of 1 patent)

7. William Morrison (1 out of 1 patent)

4 patents: Sort by Forward Citations

1. 11846653 - Scanning probe microscope and method for resonance-enhanced detection using a range of modulation frequencies (2023-12-19),

2. 11150267 - Scanning probe microscope using sensor molecules to improve photo-induced force on samples (2021-10-19),

3. 10955437 - Frequency modulation detection for photo induced force microscopy (2021-03-23),

4. 10942199 - Force microscope with helium atmosphere (2021-03-09),

Company Overview

Molecular Vista, Inc. is a leading provider of innovative nanoscale imaging solutions. Their proprietary technology allows for high-resolution imaging of chemical and physical properties at the nanoscale level. With a strong focus on research and development, Molecular Vista is at the forefront of advancing nanoscale imaging techniques for various industries including materials science, pharmaceuticals, and biotechnology.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

4 Patents

#849 in San Jose, CA

#14,063 in California

#60,704 in US

San Jose, CA, United States of America

Molecular Vista, Inc.

Forward Citations = 2

7 inventors:

Thomas R Albrecht (4 out of 167 patents)

Derek Nowak (2 out of 2 patents)

Sung I Park (2 out of 2 patents)

4. Junghoon Jahng (1 out of 1 patent)

5. Eun Seong Lee (1 out of 6 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Molecular Vista, Inc.. Retrieved from https://idiyas.com/company/molecular-vista

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]