Derek Nowak

Title: Innovations of Derek Nowak in Scanning Probe Microscopy

Introduction

Derek Nowak is a prominent inventor based in San Jose, California, known for his contributions to the field of scanning probe microscopy. With a total of two patents to his name, he has made significant advancements in the methods and technologies used in this area of research.

Latest Patents

Derek Nowak's latest patents include a scanning probe microscope and a method for resonance-enhanced detection using a range of modulation frequencies. This innovative microscope utilizes a light source that is modulated across various frequencies to irradiate the interface between the probe tip and the sample. The vibrational response of the cantilever, driven by the modulated electromagnetic radiation, is detected to derive a photo-induced force microscope (PiFM) value. His second patent involves a scanning probe microscope that employs sensor molecules to enhance the photo-induced force on samples. This method uses a resonant material situated between a metallic probe tip and the sample surface, allowing for the detection of electromagnetic radiation absorption that depends on the dielectric constant of the sample material.

Career Highlights

Derek Nowak is currently associated with Molecular Vista, Inc., where he continues to push the boundaries of scanning probe microscopy technology. His work has been instrumental in developing methods that improve the accuracy and efficiency of measurements in this field.

Collaborations

Some of his notable coworkers include Thomas R. Albrecht and Sung I. Park, who have collaborated with him on various projects related to scanning probe microscopy.

Conclusion

Derek Nowak's innovative contributions to scanning probe microscopy have paved the way for advancements in the field. His patents reflect a deep understanding of the technology and its applications, showcasing his role as a leading inventor in this area.