Molecular Vista, Inc.

Derek Nowak

Thomas R Albrecht

Sung I Park

Eun Seong Lee

Junghoon Jahng

Josh Gioja

William Morrison

A scanning probe microscope and method for resonance-enhanced detection using the scanning probe microscope uses a light source that is modulated in a range of frequencies to irradiate an interface between a probe tip of the microscope and a sample with modulated electromagnetic radiation from the light source. The vibrational response of the driven cantilever in response to the modulated electromagnetic radiation at the interface between the probe tip and the sample is then detected. The amplitude of the vibrational response of the cantilever over the entire range of modulation frequencies is measured to derive a photo-induced force microscope (PiFM) value.

Scanning probe microscope and method for resonance-enhanced detection using a range of modulation frequencies

A scanning probe microscope and method of operating the microscope uses a resonant material between a metallic probe tip and a surface of a sample with at least one material having a dielectric constant &#x3b5;. When electromagnetic radiation from a light source is transmitted to an interface between the metallic probe tip and the sample, absorption of the electromagnetic radiation by the resonant sensor material that is dependent on the dielectric constant of the at least one material of the sample is detected.

Scanning probe microscope using sensor molecules to improve photo-induced force on samples

Growing community of inventors

San Jose, CA, United States of America

Derek Nowak