The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2021
Filed:
May. 24, 2019
Molecular Vista, Inc., San Jose, CA (US);
Thomas R. Albrecht, San Jose, CA (US);
Derek Nowak, San Jose, CA (US);
Junghoon Jahng, San Jose, CA (US);
Sung I. Park, Saratoga, CA (US);
Eun Seong Lee, Daejeon, KR;
MOLECULAR VISTA, INC., San Jose, CA (US);
Abstract
A scanning probe microscope and method of operating the microscope uses a resonant material between a metallic probe tip and a surface of a sample with at least one material having a dielectric constant ε. When electromagnetic radiation from a light source is transmitted to an interface between the metallic probe tip and the sample, absorption of the electromagnetic radiation by the resonant sensor material that is dependent on the dielectric constant of the at least one material of the sample is detected.