The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2021
Filed:
Jan. 30, 2018
Applicant:
Molecular Vista, Inc., San Jose, CA (US);
Inventor:
Thomas R. Albrecht, San Jose, CA (US);
Assignee:
MOLECULAR VISTA, INC., San Jose, CA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01Q 60/34 (2010.01); G01Q 30/02 (2010.01); G01Q 30/18 (2010.01); G01Q 60/38 (2010.01);
U.S. Cl.
CPC ...
G01Q 60/34 (2013.01); G01Q 30/02 (2013.01); G01Q 30/18 (2013.01); G01Q 60/38 (2013.01);
Abstract
An atomic force microscope and method for detecting photo-induced force using the atomic force microscope utilizes light from a photonic source at a tip-sample interface that results in photo-induced force gradient, which is detected by measuring a resonant frequency of a vibrational mode of a cantilever of the atomic force microscope.