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Micronic Mydata Ab

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USPTO Granted Patents = 26

% Expired Patents = 15.4

EPO Patents = 27

Forward Citations = 124

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22 inventors (with patents filed for the assignee):

Torbjörn Sandström (7 out of 40 patents)

Mikael Wahlsten (6 out of 13 patents)

Torbjorn E Sandstrom (6 out of 46 patents)

4. Anders Svensson (4 out of 9 patents)

5. Per-Erik Gustafsson (3 out of 7 patents)

6. Jonas Walther (3 out of 3 patents)

7. Fredrik Jonsson (2 out of 6 patents)

8. Lars Stiblert (2 out of 7 patents)

9. Mats Ekberg (2 out of 4 patents)

10. Mats Rosling (1 out of 7 patents)

11. Tomas Lock (1 out of 18 patents)

12. Nils Jacobsson (1 out of 15 patents)

13. Per Askebjer (1 out of 10 patents)

14. Kristofer Karlsson (1 out of 3 patents)

15. Andreas Larsson (1 out of 2 patents)

Core Competencies:

Direct Writing

Optical Writer

Pattern Generators

Calibration Systems

Lithography Processing

Image Reading

Mura Detection

Alignment Optimization

Substrate Processing

3D Exposure

Semiconductor Manufacturing

Spatial Light Modulator

26 patents: Sort by Forward Citations

1. 11284517 - System for direct writing on an uneven surface of a workpiece that is covered with a radiation sensitive layer using exposures having different focal planes (2022-03-22),

2. 10111369 - Method and device for automatic storage of tape guides (2018-10-23),

3. 9975206 - Composition of solid-containing paste (2018-05-22),

4. 9642294 - Tape feeder and method for moving a carrier tape towards a picking position in a component mounting machine (2017-05-02),

5. 9164373 - Method and device for writing photomasks with reduced mura errors (2015-10-20),

6. 9090095 - Optical writer for flexible foils (2015-07-28),

7. 8885145 - Image reading and writing using a complex two-dimensional interlace scheme (2014-11-11),

8. 8614798 - Pattern generators, calibration systems and methods for patterning workpieces (2013-12-24),

9. 8594825 - Method and apparatus for alignment optimization with respect to plurality of layers for writing different layers with different machine configurations (2013-11-26),

10. 8594824 - Method and apparatus for performing pattern alignment to plurality of dies (2013-11-26),

11. 8570535 - Pattern generators, calibration systems and methods for patterning workpieces (2013-10-29),

12. 8530120 - Method and apparatus for performing pattern reconnection after individual or multipart alignment (2013-09-10),

13. 8488105 - Multi-table lithographic systems, lithography processing tools and methods for processing workpieces (2013-07-16),

14. 8467117 - Pattern generation systems and high bandwidth focus control system with suppressed reaction forces and noise (2013-06-18),

15. 8314941 - Cartesian coordinate measurement for rotating system (2012-11-20),

Company Overview

Micronic Mydata AB is a prominent player in the field of advanced automation and precision manufacturing solutions, primarily focusing on the semiconductor and electronics industries. The company specializes in developing innovative equipment for the production and handling of microchips, including advanced laser marking and wafer handling systems. With a strong emphasis on research and development, Micronic Mydata is dedicated to enhancing manufacturing efficiency and precision, catering to a global clientele from its headquarters in Täby, Sweden.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

26 Patents

#5 in Täby

#262 in Sweden

#24,826 in the World

Micronic Mydata Ab

Forward Citations = 124

22 inventors:

Torbjörn Sandström (7 out of 40 patents)

Mikael Wahlsten (6 out of 13 patents)

Torbjorn E Sandstrom (6 out of 46 patents)

4. Anders Svensson (4 out of 9 patents)

5. Per-Erik Gustafsson (3 out of 7 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Micronic Mydata Ab. Retrieved from https://idiyas.com/company/micronic-mydata-ab

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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